1)
A. K. Jain, A. Ross and S. Prabhakar, IEEE Trans. Circuits Syst. Video Technol. 14 [1], 4
(2004).
2)
D. Bhattacharyya, R. Ranjan, F. Alisherov and C. Minkyu, Int. J. u- e- Service Sci. Tecnol.
2 [3], 82 (2009).
3)
D. Maltoni, D. Maio, A. K. Jain and S. Prabhakar, Eds., Handbook of Fingerprint
Recognition (Springer, London, 2009) 2nd ed.
4)
S. Z. Li and A. K. Jain, Handbook of Face Recognition (Springer, London New York, 2011)
2nd ed.
5)
A. K. Jain, A. Ross and S. Pankanti, in Proceeding of 2nd International Conference on
Audio- and Video-based Biometric Person Authentication (AVBPA) (Washington D.C.,
1999) pp. 1661.
6)
J. Daugman, IEEE Trans. Syst., Man, Cybern. B 37 [5], 1167 (2007).
7)
H. Ma, Z. Liu, S. Heo, J. Lee, K. Na, H. B. Jin, S. Jung, K. Park, J. J. Kim and F. Bien, IEEE
Sensors J. 16 [22], 8124 (2016).
8)
H. Hwang, H. Lee, B. Jang, H. Kim, T. Lee and Y. Chae, SID Symp. Dig. Tech. Pap. 48 [1],
838 (2017).
9)
X. Jiang, Y. Lu, H.-Y. Tang, J. M. Tsai, E. J. Ng, M. J. Daneman, B. E. Boser and D. A.
Horsley, Microsyst Nanoeng 3 [1], 17059 (2017).
10) S. Bae, Y. Ling, W. Lin and H. Zhu, SID Symp. Dig. Tech. Pap. 49 [1], 1017 (2018).
11) B. W. An, S. Heo, S. Ji, F. Bien and J.-U. Park, Nat Commun 9 [1], 2458 (2018).
12) G.-J. Jeon, S.-H. Lee, S. H. Lee, J.-B. Shim, J.-H. Ra, K. W. Park, H.-I. Yeom, Y. Nam, O.-K.
Kwon and S.-H. K. Park, Sci Rep 9 [1], 3216 (2019).
13) D. Tordera, B. Peeters, H. B. Akkerman, A. J. J. M. Breemen, J. Maas, S. Shanmugam, A.
J. Kronemeijer and G. H. Gelinck, Adv. Mater. Technol. 4 [11], 1900651 (2019).
14) K.-J. Baeg, M. Binda, D. Natali, M. Caironi and Y.-Y. Noh, Adv. Mater. 25 [31], 4267
(2013).
15) K. Kudo and T. Moriizumi, Appl. Phys. Lett. 39 [8], 609 (1981).
16) W. H. Lee, S. Y. Chuang, H. L. Chen, W. F. Su and C. H. Lin, Thin Solid Films 518 [24],
7450 (2010).
17) B. Hajduk, H. Bednarski, B. Jarząbek, H. Janeczek and P. Nitschke, Beilstein J.
Nanotechnol. 9, 1108 (2018).
89
18) L. Hrostea, M. Girtan, R. Mallet and L. Leontie, IOP Conf. Ser.: Mater. Sci. Eng. 374,
012015 (2018).
19) H. Maruhashi, T. Oku, A. Suzuki, T. Akiyama and Y. Yamasaki, in AIP Conference
Proceedings (Tsukuba-city, Ibaraki, Japan, 2015) Vol. 1649 pp. 89.
20) E. Zakhidov, M. Imomov, V. Quvondikov, S. Nematov, I. Tajibaev, A. Saparbaev, I. Ismail,
B. Shahid and R. Yang, Appl. Phys. A 125 [11], 803 (2019).
21) F. L. Khairulaman, C. C. Yap and M. H. Hj Jumali, Mater. Lett. 283, 128827 (2021).
22) T. Someya, Y. Kato, S. Iba, Y. Noguchi, T. Sekitani, H. Kawaguchi and T. Sakurai, IEEE
Trans. Electron Devices 52 [11], 2502 (2005).
23) G. Simone, M. J. Dyson, S. C. J. Meskers, R. A. J. Janssen and G. H. Gelinck, Adv. Funct.
Mater. 30 [20], 1904205 (2020).
24) M. Biele, C. Montenegro Benavides, J. Hürdler, S. F. Tedde, C. J. Brabec and O. Schmidt,
Adv. Mater. Technol. 4 [1], 1800158 (2019).
25) M. Kielar, O. Dhez, G. Pecastaings, A. Curutchet and L. Hirsch, Sci Rep 6 [1], 39201
(2016).
26) X. Zhou, D. Yang and D. Ma, Advanced Optical Materials 3 [11], 1570 (2015).
27) A. Pierre, I. Deckman, P. B. Lechêne and A. C. Arias, Adv. Mater. 27 [41], 6411 (2015).
28) C. Xie, T. Heumüller, W. Gruber, X. Tang, A. Classen, I. Schuldes, M. Bidwell, A. Späth, R.
H. Fink, T. Unruh, I. McCulloch, N. Li and C. J. Brabec, Nat Commun 9 [1], 5335 (2018).
29) F. J. M. Colberts, M. M. Wienk and R. A. J. Janssen, ACS Appl. Mater. Interfaces 9 [15],
13380 (2017).
30) J. Zhao, Y. Li, G. Yang, K. Jiang, H. Lin, H. Ade, W. Ma and H. Yan, Nat Energy 1 [2],
15027 (2016).
31) M. C. Scharber and N. S. Sariciftci, Progress in Polymer Science 38 [12], 1929 (2013).
32) Y. Huang, E. J. Kramer, A. J. Heeger and G. C. Bazan, Chem. Rev. 114 [14], 7006 (2014).
33) R. D. Jansen-van Vuuren, A. Armin, A. K. Pandey, P. L. Burn and P. Meredith, Adv.
Mater. 28 [24], 4766 (2016).
34) A. Armin, R. D. Jansen-van Vuuren, N. Kopidakis, P. L. Burn and P. Meredith, Nat
Commun 6 [1], 6343 (2015).
35) B. Siegmund, A. Mischok, J. Benduhn, O. Zeika, S. Ullbrich, F. Nehm, M. Böhm, D.
Spoltore, H. Fröb, C. Körner, K. Leo and K. Vandewal, Nat Commun 8 [1], 15421 (2017).
36) S. Ullbrich, B. Siegmund, A. Mischok, A. Hofacker, J. Benduhn, D. Spoltore and K.
Vandewal, J. Phys. Chem. Lett. 8 [22], 5621 (2017).
90
37) Z. Tang, Z. Ma, A. Sánchez-Díaz, S. Ullbrich, Y. Liu, B. Siegmund, A. Mischok, K. Leo, M.
Campoy-Quiles, W. Li and K. Vandewal, Adv. Mater. 29 [33], 1702184 (2017).
38) M. R. Esopi, M. Calcagno and Q. Yu, Adv. Mater. Technol. 2 [8], 1700025 (2017).
39) N. Strobel, M. Seiberlich, R. Eckstein, U. Lemmer and G. Hernandez-Sosa, Flex. Print.
Electron. 4 [4], 043001 (2019).
40) S. A. Choulis, J. Nelson, Y. Kim, D. Poplavskyy, T. Kreouzis, J. R. Durrant and D. D. C.
Bradley, Appl. Phys. Lett. 83 [18], 3812 (2003).
41) G. Garcia-Belmonte, A. Munar, E. M. Barea, J. Bisquert, I. Ugarte and R. Pacios, Organic
Electronics 9 [5], 847 (2008).
42) T. M. Clarke, C. Lungenschmied, J. Peet, N. Drolet and A. J. Mozer, Adv. Energy Mater. 5
[4], 1401345 (2015).
43) S. Kasap, J. B. Frey, G. Belev, O. Tousignant, H. Mani, J. Greenspan, L. Laperriere, O.
Bubon, A. Reznik, G. DeCrescenzo, K. S. Karim and J. A. Rowlands, Sensors 11 [5], 5112
(2011).
44) G. A. H. Wetzelaer, M. Kuik, M. Lenes and P. W. M. Blom, Appl. Phys. Lett. 99 [15],
153506 (2011).
45) Th. Martin and R. Landauer, Phys. Rev. B 45 [4], 1742 (1992).
46) I. K. Kim, J. H. Jo, J. (Brian) Lee and Y. J. Choi, Organic Electronics 57, 89 (2018).
47) G. H. Gelinck, A. Kumar, D. Moet, J.-L. van der Steen, U. Shafique, P. E. Malinowski, K.
Myny, B. P. Rand, M. Simon, W. Rütten, A. Douglas, J. Jorritsma, P. Heremans and R.
Andriessen, Organic Electronics 14 [10], 2602 (2013).
48) T. N. Ng, W. S. Wong, M. L. Chabinyc, S. Sambandan and R. A. Street, Appl. Phys. Lett.
92 [21], 213303 (2008).
49) C. Zhao, J. Kanicki, A. C. Konstantinidis and T. Patel, Med. Phys. 42 [11], 6294 (2015).
50) T. Kamada, R. Hatsumi, K. Watanabe, S. Kawashima, M. Katayama, H. Adachi, T.
Ishitani, K. Kusunoki, D. Kubota and S. Yamazaki, J Soc Inf Display 27 [6], 361 (2019).
51) H. Akkerman, B. Peeters, A. Breemen, S. Shanmugam, L. Ugalde Lopez, D. Tordera, R.
Ketterij, E. Delvitto, R. Verbeek, P. Malinowski, T. Ke, F. De Roose, L. Moreno Hagelsieb,
I. Katsouras, A. J. Kronemeijer, E. Meulenkamp and G. Gelinck, J Soc Inf Display 29 [12],
935 (2021).
52) C. M. Lochner, Y. Khan, A. Pierre and A. C. Arias, Nat Commun 5 [1], 5745 (2014).
53) Y. Khan, D. Han, A. Pierre, J. Ting, X. Wang, C. M. Lochner, G. Bovo, N. Yaacobi-Gross, C.
Newsome, R. Wilson and A. C. Arias, Proc. Natl. Acad. Sci. U.S.A.
[ DOI:10.1073/pnas.1813053115].
91
54) M. Gao, L. Li and Y. Song, J. Mater. Chem. C 5 [12], 2971 (2017).
55) Y. Dong, Y. Zou, J. Song, Z. Zhu, J. Li and H. Zeng, Nano Energy 30, 173 (2016).
56) Z. Bao and X. Chen, Adv. Mater. 28 [22], 4177 (2016).
57) H. Lee, H. Ko and J. Lee, ICT Express 2 [4], 195 (2016).
58) E. D. Chan, M. M. Chan and M. M. Chan, Respiratory Medicine 107 [6], 789 (2013).
59) T. Tamura, Y. Maeda, M. Sekine and M. Yoshida, Electronics 3 [2], 282 (2014).
60) A. Caizzone, A. Boukhayma and C. Enz, IEEE Electron Device Lett. 40 [11], 1828 (2019).
61) A. Bilgaiyan, F. Elsamnah, H. Ishidai, C.-H. Shim, M. A. B. Misran, C. Adachi and R.
Hattori, ACS Appl. Electron. Mater. 2 [5], 1280 (2020).
62) C.-Y. Huang, M.-C. Chan, C.-Y. Chen and B.-S. Lin, Sensors 14 [9], 17586 (2014).
63) F. Elsamnah, A. Bilgaiyan, M. Affiq, C.-H. Shim, H. Ishidai and R. Hattori, Biosensors 9
[3], 87 (2019).
64) M. Hiraoka, M. Firbank, M. Essenpreis, M. Cope, S. R. Arridge, P. van der Zee and D. T.
Delpy, Phys. Med. Biol. 38 [12], 1859 (1993).
65) J. L. Reuss and D. Siker, J Clin Monit Comput 18 [4], 289 (2004).
66) V. A. Peris and S. Hu, J. Phys.: Conf. Ser. 85, 012027 (2007).
67) S. Chatterjee and P. Kyriacou, Sensors 19 [4], 789 (2019).
68) K.-C. Huang, C.-L. Chang, H.-C. Chang and C.-H. Chang, in 2012 IEEE International
Instrumentation and Measurement Technology Conference Proceedings (IEEE, Graz,
Austria, 2012) pp. 1246.
69) V. V. Tuchin, J. biomed. photonics eng. 1 [2], 98 (2015).
70) V. Tuchin, J. biomed. photonics eng. 2 [3], 030201 (2016).
71) I. V. Meglinsky and S. J. Matcher, Med. Biol. Eng. Comput. 39 [1], 44 (2001).
72) I. V. Meglinski and S. J. Matcher, Computer Methods and Programs in Biomedicine 70
[2], 179 (2003).
73) J. L. Latham and S. N. Martin, Am Fam Physician 89 [12], 956 (2014).
74) L. Jazayeri, J. Q. Klausner and J. Chang, Plast Reconstr Surg 132 [5], 1207 (2013).
75) C. Y. Chia and T. Nassif, Rev. Bras. Cir. Plást. 26 [4], 714 (2011).
76) C. Y. Chia and T. Nassif, Rev. Bras. Cir. Plást. [ DOI:10.5935/2177-1235.2015RBCP0185].
77) A. N. Bashkatov, E. A. Genina and V. V. Tuchin, J. Innov. Opt. Health Sci. 04 [01], 9
(2011).
78) T. Lister, P. A. Wright and P. H. Chappell, J Biomed Opt 17 [9], 90901 (2012).
79) N. Bosschaart, G. J. Edelman, M. C. G. Aalders, T. G. van Leeuwen and D. J. Faber, Lasers
Med Sci 29 [2], 453 (2014).
92
80) Y. Kwon, M. Kim, S. Park, M. Jeong, S. M. Lee, S. H. Lee, W. H. Lee, Y. K. Choi and J. Y.
Lee, in 2020 IEEE Symposium on VLSI Circuits (IEEE, Honolulu, HI, USA, 2020) pp. 1.
81) C. Peng, M. Chen, H. Wang, J. Shen and X. Jiang, IEEE Sensors J. 20 [19], 11221 (2020).
82) C. Peng, M. Chen and X. Jiang, IEEE Sensors J. 21 [6], 7412 (2021).
83) Y. Qin, H. Wang and Y. Liu, SID Symposium Digest of Technical Papers 49 [1], 1604
(2018).
84) D. Tordera, B. Peeters, E. Delvitto, S. Shanmugam, J. Maas, J. Riet, R. Verbeek, R. Laar,
T. Bel, G. Haas, L. Ugalde, A. Breemen, I. Katsouras, A. J. Kronemeijer, H. Akkerman, E.
Meulenkamp and G. Gelinck, J Soc Inf Display 28 [5], 381 (2020).
85) W.-F. Zhou, L.-Q. Chen, Y.-L. Sun, L. Shi, Z. Liu, F. Guan and D. Wang, SID Symposium
Digest of Technical Papers 49 [1], 1014 (2018).
86) Y. Zeng, F. Lu, Q. Yao, H. Yu, Q. Zhang and X. Su, SID Symposium Digest of Technical
Papers 52 [S1], 49 (2021).
87) A. K. Jain, Y. Chen and M. Demirkus, IEEE Trans. Pattern Anal. Mach. Intell. 29 [1], 15
(2007).
88) National Institute of Standards and Technology, American national standard for
information systems. NIST SP 500-245 (National Institute of Standards and Technology,
Gaithersburg, MD, 2000) 0 ed.
89) J. M. Libert, S. Orandi and J. D. Grantham, Comparison of the WSQ and JPEG 2000
image compression algorithms on 500 ppi fingerprint imagery NIST IR 7781 (National
Institute of Standards and Technology, Gaithersburg, MD, 2012) 0 ed.
90) J. J. M. Halls, K. Pichler, R. H. Friend, S. C. Moratti and A. B. Holmes, Appl. Phys. Lett. 68
[22], 3120 (1996).
91) D. E. Markov, J. C. Hummelen, P. W. M. Blom and A. B. Sieval, Phys. Rev. B 72 [4],
045216 (2005).
92) W. A. Luhman and R. J. Holmes, Adv. Funct. Mater. 21 [4], 764 (2011).
93) O. V. Mikhnenko, P. W. M. Blom and T.-Q. Nguyen, Energy Environ. Sci. 8 [7], 1867
(2015).
94) B. A. Gregg, J. Sprague and M. W. Peterson, J. Phys. Chem. B 101 [27], 5362 (1997).
95) H. Najafov, B. Lee, Q. Zhou, L. C. Feldman and V. Podzorov, Nature Mater 9 [11], 938
(2010).
96) A. R. Newmark and U. Stimming, Journal of Electroanalytical Chemistry and Interfacial
Electrochemistry 204 [1–2], 197 (1986).
97) A. R. Newmark and U. Stimming, Electrochimica Acta 32 [8], 1217 (1987).
93
98) S. M. Menke and R. J. Holmes, Energy Environ. Sci. 7 [2], 499 (2014).
99) L. Onsager, The Journal of Chemical Physics 2 [9], 599 (1934).
100) T. Offermans, S. C. J. Meskers and R. A. J. Janssen, The Journal of Chemical Physics 119
[20], 10924 (2003).
101) I. Montanari, A. F. Nogueira, J. Nelson, J. R. Durrant, C. Winder, M. A. Loi, N. S. Sariciftci
and C. Brabec, Appl. Phys. Lett. 81 [16], 3001 (2002).
102) A. M. Goodman and A. Rose, Journal of Applied Physics 42 [7], 2823 (1971).
103) A. Liu, S. Zhao, S.-B. Rim, J. Wu, M. Könemann, P. Erk and P. Peumans, Adv. Mater. 20
[5], 1065 (2008).
94
APPENDIX A
OPTICAL RAY TRACING SIMULATION
A1: Unfiltered ray tracing for the skin model.
95
A2: (Front-view) Unfiltered ray tracing for the finger model based on
transmission-based system.
A3: (Side-view) Unfiltered ray tracing for the finger model based on
transmission-based system.
96
A4: (Front-view) Unfiltered ray tracing for the finger model based on
reflection-based system.
A5: (Side-view) Unfiltered ray tracing for the finger model based on
reflection-based system.
97
APPENDIX B
LAYOUT DESIGN
B1: Overview of the photomask for the IDE OPD devices.
98
B2: Closed-up view at area I from A1. Area II shows the single OPD
device for the verification purpose. Area III shows the IDE OPDs with
the most left is the perfectly aligned between the exposed area and
opening window. The most right in area III shows the IDE OPDs with
100% shifted to the right side exposing the boundaries of the covered
electrodes. Conversely, in area IV the most right is the perfectly
aligned device structure and the most left is 100% shifted to the left.
99
B3: Overview of the single OPD device.
B4: Overview of the IDE OPDs with perfectly aligned between
opening window and exposed electrodes for the smallest feature size
based on Table 5.1.
100
EE
CE
B5: Closed-up view at the exposed electrodes (EE) and covered
electrodes (CE).
B6: Overview of the IDE OPDs for largest feature size based on
Table 5.1 with the opening windows were 100% shifted to the right.
101
Opening window
EE
CE
B7: Closed-up view at the electrodes which 100% shifted to the right
for the largest feature size used for the device structure.
...
論文の公開元へ
