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Nondestructive thickness measurement of silica scale using cathodoluminescence

Susumu Imashuku Wataru Hashimoto Kazuaki Wagatsuma 東北大学 DOI:10.1016/j.saa.2020.119022

2020.10.03

概要

The knowledge of the composition, morphology, and thickness of surface protective scales, such as SiO2 and Al2O3, is important to control the performance of heat-resistant alloys operated at high temperatures above 1000 °C. Cathodoluminescence (CL) analysis is one of the most promising methods to acquire such information nondestructively. Unlike Al scales formed on Fe-20%Si alloy, Si, and MoSi2 to present a method for measuring the thickness of SiO2 scale on silica-forming materials from their CL spectra. A linear calibration curve was obtained from the intensity of the CL peak at 445 nm which originated from the intrinsic defects in SiO scale thickness, regardless of the type of base materials. These results indicated that the thickness of the SiO2 scale formed on silica-forming alloys can be determined by acquiring their CL spectra. Therefore, CL analysis has the potential to be employed as a novel analytical method to control the performance of silica-forming alloys.

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