Relative Formation Rate Constants and Electronic-State Distributions of Ne* Produced from the Ne^+/SF_<6^-> and Ne^+/C_6F_<6-> Ion-Ion Neutralization Reactions in the He Flowing Afterglow
概要
Relative formation rate constants, 𝑘ሺ𝑢ሻ, and electronic-state distributions, 𝑁ሺ𝑢ሻ, of Ne* for upper 𝑢 states in the Ne+/SF6- and Ne+/C6F6- ion-ion neutralization (I-IN) reactions were determined by observing Ne* atomic emissions in the 200–990 nm region. Ne* emissions from forty-two ns(n=4 and 5), ns' (n=4 and 5), np(n=3 and 4), np' (n=3 and 4), and 4d states in the 18.38–20.71 eV region were identified in the Ne+/SF6- reaction, whereas those from forty-five ns(n=4 and 5), ns' (n=4 and 5), np(n=3 and 4), np' (n=3 and 4), nd(n=3–5), and nd' (n=3 and 4) states in the 18.38–21.02 eV region were observed in the Ne+/C6F6- reaction. Major product Ne* states were 4s', 3d, and 3d' states in the Ne+/SF6- reaction, whereas they were 3p, 4s', 3d, 3d', and 5d states in the Ne+/C6F6- reaction. The electronic-state distributions of Ne* in the Ne+/SF6- and Ne+/C6F6- reactions suggested that Ne* atoms are not formed through long-lived Ne+–SF6- and Ne+–C6F6- complexes, where excess energies are distributed to products statistically. It was concluded that electronic-state distributions of Ne* are governed by the transition probability from the attractive Ne+–SF6- and Ne+–C6F6- entrance potentials to flat Ne*–SF6 and Ne*–C6F6 exit potentials at crossing points.